Horus A系列 – 晶圓AI Auto OM

Horus A系列 – 晶圓AI Auto OM

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This product is designed for detecting defects in non-periodically arranged, diverse, and complex background pattern products, integrating depth synthesis, field stitching, and 2D measurement functions.

  • The description claims the product is suitable for detecting defects in non-periodically arranged, diverse, and complex background pattern products.

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Takes ~2 minutes. No storefront changes.