MZT-11 E-Field (static and dynamic electric field) Simulator Tip Assembly

DIAGNOSTIC E-FIELD SIMULATION: to identify EUT locations sensitive to both static and dynamic E-fields, using super-fast, real-world risetimes. The Model MZT-11 E-Field Simulation Tip provides: • Repeatable, local static E-field simulation. Used for interrogating high-impedance circuits for upsets due to various levels of fixed or slowly-changing electric fields. • Repeatable, fast-risetime, local dynamic E-field simulation, while simultaneously minimizing the effects of local ESD-generated H-fields. Used for repeatably simulating the steep change in E-field associated with an ESD. The purpose is to isolate circuits sensitive to the real-world ESD E-field, which can often have sub-nanosecond edges. To ensure a fast E-field risetime, the Model MZT-11 E-field simulating tip is driven by the MiniZap’s contact mode simulation circuits, NOT by a slow, air-gap discharge as in some other ESD simulators.