SU3900SE FE-SEM
The Hitachi SU3900SE is a high-resolution FE-SEM for observing large and heavy specimens or multiple specimens. It offers enhanced resolution, automated beam alignment, and customizable observation recipes.
- The SU3900SE can accommodate samples up to 300 mm in diameter and 130 mm height.
- The microscope provides both compositional and topographic information through its low-accelerating-voltage high-sensitivity backscattered electron detector.
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