Wallis L系列 – 玻璃晶圓複合自動光學檢測機

Wallis L系列 – 玻璃晶圓複合自動光學檢測機

0.00 TWD In stock Buy at Merchant

This product performs line scan inspection and AI-based defect classification for silicon and glass wafers. It can be used for CIS/IQC/OQC applications and supports 8”/12” EFEM with SECS GEM200/300.

  • The description claims the product can be used for CIS/IQC/OQC applications.

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