STADI MP

STADI MP X-Ray Diffraction System The STADI MP by STOE is a versatile X-ray diffraction system that integrates multiple measurement geometries into a single platform. Designed for flexibility and precision, it enables seamless switching between configurations without the need for realignment. Key Features Multiple single-photon-counting X-ray detectors (MYTHEN series) Supports high and low temperature attachments Combines Transmission/Debye-Scherrer, Bragg-Brentano, and micro-diffraction modes Geometry selection via sliding tube housing Pure Kα1 radiation (Co, Cu, Mo, Ag) across all configurations Core Advantages One goniometer supporting three geometries: Transmission (Debye-Scherrer) High Flux / Micro-diffraction Bragg-Brentano No need to exchange optics or perform realignment between modes Consistent high-quality data across all measurement setups Ideal for both routine analysis and advanced research applications Transmission Geometry Benefits Constant sample volume across the full 2θ range Reliable intensity without additional corrections No line broadening for weak absorbers No height displacement errors Enables true micro-sampling Reduced preferred orientation effects Specifications (Summary) 2θ range: -10° to 140° (depending on geometry) Goniometer: 2-circle system Measuring radius: 140 – 573 mm (depending on setup) Focusing radius: 160 mm X-ray sources: Co, Cu, Mo, Ag (sealed tubes) Detectors: MYTHEN2 R (1K / 2K / 3K / 4K) Software: WinXPOW Dimensions: 1800 × 880 × 2050 mm Weight: ~870 kg Software & Accessories Powered by WinXPOW, offering: Instrument control and automation Data reduction and analysis (profile fitting, indexing, space group determination) Advanced 2D and 3D visualization tools Available accessories include: High- and low-temperature attachments Reaction chambers for reflection samples Various sample stages and changers Specialized holders for precise alignment Applications Powder diffraction analysis Micro-diffraction studies High-temperature and in-situ experiments Air- and moisture-sensitive sample analysis Advanced materials characterization