TLSW-H1.1 SWIR Telecentric Lens Series | 950–1800nm for 1.1" InGaAs Sensors

Product Description The TLSW Series SWIR Telecentric Lenses are optimized for 1.1" InGaAs sensors, including the Sony IMX990, delivering high-precision imaging across the 950–1800 nm spectral range. Available in 0.5×, 0.7×, 1×, 2×, and 4× magnifications, these lenses reveal material differences and defects invisible to visible-light systems. Designed for machine vision and precision metrology, the TLSW Series offers ultra-low distortion, high resolution, and both coaxial and non-coaxial configurations. The 1× and 2× models feature adjustable iris control for flexible depth-of-field optimization. Compatible with SWIR cameras and C-Mount systems, these lenses are ideal for semiconductor inspection, wafer analysis, solar cell inspection, and scientific imaging applications. Key Features Optimized for Sony IMX990 and 1.1" InGaAs sensors SWIR transmission from 950–1800 nm Magnifications from 0.5× to 4× Ultra-low distortion and high resolution Coaxial and non-coaxial versions available Adjustable iris on 1× and 2× models C-Mount interface for easy integration Suitable for precision measurement and SWIR inspection Main Applications Semiconductor and wafer inspection Solar cell and photovoltaic analysis Precision metrology Electronics inspection Material identification SWIR machine vision Scientific imaging and research Specifications 1.1" C-Mount 950-1800nm SWIR Telecentric Lens Model Coaxial Mag. WD F/# DOF TLSW-0.5XD-H1.1 Yes 0.5× 116.4mm 6.3 2.02mm TLSW-0.7XD-H1.1 Yes 0.7× 116.0mm 6.4 1.05mm TLSW-1.0XD-H1.1 Yes 1.0× 110.0mm 7.0 0.56mm TLSW-1.0X-H1.1 No 1.0× 110.0mm 7.0 0.56mm TLSW-2.0XD-H1.1 Yes 2.0× 110.2mm 11.5 0.23mm TLSW-2.0X-H1.1 No 2.0× 110.2mm 11.5 0.23mm TLSW-4.0XD-H1.1 Yes 4.0× 110.3mm 20.0 0.10mm