MSE PRO Fully Automatic Wafer Stage Contact Angle Goniometer
The MSE PRO Fully Automatic Wafer Stage Contact Angle Goniometer is a high-end system for automated wettability analysis of large semiconductor wafers, offering precise measurements and high-throughput testing.
- The system supports up to 12-inch wafer measurement.
- It can generate over 100 data points on a single wafer.
- It features a fully automated 3D motion stage with 360° rotation.
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- Default Title — 41886.95 USD — In stock
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