AFM-TIP-C-AFM Probes #1300005033

Unlocking New possibilities: Exploring the Capabilities of AFM-TIP-C-AFM Probes AFM-TIP-C-AFM probes are sharp silicon probes for alternative contact/non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. Compatibility: These probes are compatible with HORIBA SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities. Quantity: A set of 15 tips. 15 AFM tips for SKM/KPFM, Conductive AFM, EFM, Spreading resistance, with backside coating CR/AU. Compatible for colocalized AFM/Raman-PL. Proper maintenance and timely replacement of components are crucial to ensure the accuracy and longevity of the system. Specifications: ROC (nm) <35 Height (µm) 12-18 Shape Rotated Coating Cr-Au Cantilever specification Material Si Shape Beam Reflex side coating Cr-Au Parameter (nom/min/max) Length (µm) 125/120/130 Width (µm) 25/22/28 k (N/m) 5/1.8/13 f (kHz) 160/110/220 Thickness (µm) 2.1/1.6/2.6 Maintenance and replacement: Regularly inspect probes for signs of wear or damage. Ensure that the probe holder and mounting hardware are secure and undamaged. Maintain a stable environment for the AFM-Raman system to prevent drift and noise. Clean probes regularly to prevent contamination. If you want more information about this topic please visit our website on What is co-localized AFM/Raman? - HORIBA.