AreX L Retained Austenite Analyzer by X-Ray Diffraction
type: Product
description: GNR AreX L Retained Austenite Analyzer by X-Ray Diffraction (XRD) The GNR AreX L is a fully automated X-Ray Diffraction (XRD) Retained Austenite Analyzer specifically developed for the accurate quantitative determination of retained austenite in heat-treated steels. Designed in full compliance with ASTM E 975-03, the system provides highly reliable and repeatable measurements, making it an essential solution for quality control, process optimization, and metallurgical research. Using advanced X-Ray Diffraction technology, the AreX L measures the integrated diffraction intensities of both austenite and ferrite phases to accurately calculate retained austenite content. By analyzing multiple diffraction peaks, the instrument minimizes the effects of preferred crystallographic orientation while detecting possible carbide interference, ensuring precise and dependable results even at low retained austenite concentrations. Unlike conventional metallographic methods, which may be influenced by operator interpretation, the GNR AreX L delivers fully automated and objective measurements with excellent repeatability. The system enables retained austenite volume percentage to be determined within just a few minutes by simply positioning the sample and starting the analysis, significantly improving laboratory productivity and manufacturing efficiency. Combining high analytical accuracy, user-friendly operation, and industry-standard compliance, the GNR AreX L is the ideal solution for steel manufacturers, heat treatment facilities, automotive suppliers, research laboratories, and quality assurance departments requiring reliable retained austenite determination. Key Features Dedicated X-Ray Diffraction (XRD) system for retained austenite analysis Fully automated retained austenite measurement Compliant with ASTM E 975-03 Standard Practice High-precision quantitative phase analysis Measures retained austenite down to very low concentrations Multi-peak diffraction analysis for impro…
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